New Delhi: Jawaharlal Nehru University is offering a first-of-its kind certificate course in Electron Microscopy for science graduates.
"The course under skill development programme comprising interactive lectures and extensive hands-on practical training in groups of four or less using state-of-the-art electron microscopy facility is on offer at our Advanced Instrumentation Research Facility (AIRF)," a senior university official said.
The course with a five-day module will run from July 27-31 and is open to BSc, BE, BTech and diploma holders in engineering and technology or equivalent.
"This will be a trial run for the course and whether it will be a regular feature in the varsity's academic calender or not is yet to be decided," the official said, adding, "students enroling for the course this time would be given certificates."
Transmission Electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through.
The course will be divided in four parts: working principal of electron microscopy; instrumentation of electron microscopy; sample preparation for scanning electron microscopy (SEM) and transmission electron microscopy (TEM) and recent development in Electron Microscopy.
AIRF is a specialised research facility housing state-of-the-art instruments and supporting basic facilities created with an objective of providing a central facility of latest and advanced analytical instruments for research in the application areas of physical, environmental, biological, allied and interdisciplinary sciences.